JPH046089B2 - - Google Patents
Info
- Publication number
- JPH046089B2 JPH046089B2 JP58171382A JP17138283A JPH046089B2 JP H046089 B2 JPH046089 B2 JP H046089B2 JP 58171382 A JP58171382 A JP 58171382A JP 17138283 A JP17138283 A JP 17138283A JP H046089 B2 JPH046089 B2 JP H046089B2
- Authority
- JP
- Japan
- Prior art keywords
- gaas
- film
- based compound
- compound semiconductor
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/061—Manufacture or treatment of FETs having Schottky gates
- H10D30/0612—Manufacture or treatment of FETs having Schottky gates of lateral single-gate Schottky FETs
- H10D30/0616—Manufacture or treatment of FETs having Schottky gates of lateral single-gate Schottky FETs using processes wherein the final gate is made before the completion of the source and drain regions, e.g. gate-first processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28575—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising AIIIBV compounds
- H01L21/28587—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising AIIIBV compounds characterised by the sectional shape, e.g. T, inverted T
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
- Junction Field-Effect Transistors (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58171382A JPS6064430A (ja) | 1983-09-19 | 1983-09-19 | GaAs系化合物半導体装置の製造方法 |
US06/602,578 US4540446A (en) | 1983-09-19 | 1984-04-20 | Method of forming ohmic contact on GaAs by Ge film and implanting impurity ions therethrough |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58171382A JPS6064430A (ja) | 1983-09-19 | 1983-09-19 | GaAs系化合物半導体装置の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6064430A JPS6064430A (ja) | 1985-04-13 |
JPH046089B2 true JPH046089B2 (en]) | 1992-02-04 |
Family
ID=15922140
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58171382A Granted JPS6064430A (ja) | 1983-09-19 | 1983-09-19 | GaAs系化合物半導体装置の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6064430A (en]) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0666454B2 (ja) * | 1985-04-23 | 1994-08-24 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | ▲iii▼―▲v▼族半導体デバイス |
JPS62205622A (ja) * | 1986-03-06 | 1987-09-10 | Agency Of Ind Science & Technol | オ−ミツク接触の形成方法 |
US4983653A (en) * | 1986-11-12 | 1991-01-08 | Diafoil Company, Ltd. | Polyester shrinkable film containing benzotriazole |
EP0267799B1 (en) * | 1986-11-12 | 1993-08-18 | Diafoil Hoechst Co., Ltd | Shrinkable polyester film |
JPH0750781B2 (ja) * | 1987-03-18 | 1995-05-31 | 富士通株式会社 | 化合物半導体集積回路装置 |
-
1983
- 1983-09-19 JP JP58171382A patent/JPS6064430A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6064430A (ja) | 1985-04-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6239835B2 (en]) | ||
US4540446A (en) | Method of forming ohmic contact on GaAs by Ge film and implanting impurity ions therethrough | |
JPH046089B2 (en]) | ||
US4712291A (en) | Process of fabricating TiW/Si self-aligned gate for GaAs MESFETs | |
JPS6160591B2 (en]) | ||
JPH028457B2 (en]) | ||
JPS61187277A (ja) | 電界効果トランジスタの製造方法 | |
JPH0586853B2 (en]) | ||
JPS6396914A (ja) | 半導体装置の製造方法 | |
JPH0620080B2 (ja) | 半導体素子の製造方法 | |
JPH0783026B2 (ja) | 電界効果トランジスタの製造方法 | |
JPH0666336B2 (ja) | 電界効果トランジスタの製造方法 | |
JPS6122872B2 (en]) | ||
JPS6050966A (ja) | 電界効果トランジスタの製造方法 | |
JPH0257340B2 (en]) | ||
JPH0439772B2 (en]) | ||
JPH0810706B2 (ja) | 電界効果トランジスタの製造方法 | |
JPS59191384A (ja) | 半導体装置の製造方法 | |
JPH01293571A (ja) | 半導体素子の製造方法 | |
JPH0434821B2 (en]) | ||
JPS6187378A (ja) | 化合物半導体装置の製造方法 | |
JPS6232656A (ja) | 半導体装置及びその製造方法 | |
JPS58202577A (ja) | 電界効果トランジスタの製造方法 | |
JPH1027841A (ja) | 半導体装置,及びその製造方法 | |
JPH01186678A (ja) | 半導体装置の製造方法 |